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Total properties:
38
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Patent #:
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Issue Dt:
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09/02/1980
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Application #:
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06022480
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Filing Dt:
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03/21/1979
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Title:
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METHOD FOR THE CONTACTLESS MEASUREMENT OF THE POTENTIAL WAVEFORM IN AN ELECTRONIC COMPONENT AND ARRANGEMENT FOR IMPLEMENTING THE METHOD
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Patent #:
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Issue Dt:
|
09/02/1980
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Application #:
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06022484
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Filing Dt:
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03/21/1979
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Title:
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METHOD FOR THE CONTACTLESS MEASUREMENT OF THE POTENTIAL WAVEFORM IN AN ELECTRONIC COMPONENT AND APPARATUS FOR IMPLEMENTING THE METHOD
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Patent #:
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Issue Dt:
|
09/16/1980
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Application #:
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06022493
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Filing Dt:
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03/21/1979
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Title:
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METHOD FOR ELECTRONICALLY IMAGING THE POTENTIAL DISTRIBUTION IN AN ELECTRONIC COMPONENT AND ARRANGEMENT FOR IMPLEMENTING THE METHOD
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Patent #:
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Issue Dt:
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12/23/1980
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Application #:
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06030378
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Filing Dt:
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04/16/1979
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Title:
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SCANNING ELECTRON MICROSCOPE
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|
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Patent #:
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Issue Dt:
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10/20/1981
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Application #:
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06041613
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Filing Dt:
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05/23/1979
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Title:
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TECHNIQUES FOR IMPRESSING A VOLTAGE WITH AN ELECTRON BEAM
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Patent #:
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Issue Dt:
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07/07/1981
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Application #:
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06105892
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Filing Dt:
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12/21/1979
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Title:
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APPARATUS AND METHOD FOR CONTACT-FREE POTENTIAL MEASUREMENTS OF AN ELECTRINIC COMPOSITION
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Patent #:
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Issue Dt:
|
07/12/1983
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Application #:
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06240881
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Filing Dt:
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03/05/1981
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Title:
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HIGH CURRENT ELECTRON SOURCE
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Patent #:
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Issue Dt:
|
07/17/1984
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Application #:
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06284827
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Filing Dt:
|
07/20/1981
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Title:
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METHOD FOR MEASURING RESISTANCES AND CAPACITANCES OF ELECTRONIC COMPONENTS
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|
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Patent #:
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|
Issue Dt:
|
12/04/1984
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Application #:
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06284828
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Filing Dt:
|
07/20/1981
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Title:
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ELECTRON BEAM TESTING DEVICE FOR STROBOSCOPIC MEASUREMENT OF HIGH-FREQUENCY, PERIODIC EVENTS
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Patent #:
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Issue Dt:
|
10/25/1983
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Application #:
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06287133
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Filing Dt:
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07/27/1981
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Title:
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METHOD AND ARRANGEMENT FOR QUANTITATIVE POTENTIAL MEASUREMENTS ON SURFACE-WAVE FILTERS
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|
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Patent #:
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Issue Dt:
|
11/01/1983
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Application #:
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06287134
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Filing Dt:
|
07/27/1981
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Title:
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ARRANGEMENT FOR STROBOSCOPIC POTENTIAL MEASUREMENTS WITH AN ELECTRON BEAM TESTING DEVICE
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|
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Patent #:
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|
Issue Dt:
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09/11/1984
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Application #:
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06341106
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Filing Dt:
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01/20/1982
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Title:
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METHOD FOR REPRESENTING LOGICAL STATUS CHANGES OF A PLURALITY OF ADJACENT CIRCUIT NODES IN AN INTEGRATED CIRCUIT IN A LOGIC IMAGE EMPLOYING A PULSED ELECTRON PROBE
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Patent #:
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Issue Dt:
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08/07/1984
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Application #:
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06409630
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Filing Dt:
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08/19/1982
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Title:
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OPPOSING FIELD SPECTROMETER FOR ELECTRON BEAM MENSURATION TECHNOLOGY
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|
|
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Patent #:
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|
Issue Dt:
|
09/03/1985
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Application #:
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06499484
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Filing Dt:
|
05/31/1983
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Title:
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METHOD AND APPARATUS FOR SUPPRESSING DISTURBANCES IN THE MEASUREMENT OF SIGNALS WITH A PARTICLE PROBE
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|
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Patent #:
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Issue Dt:
|
04/30/1985
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Application #:
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06643108
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Filing Dt:
|
08/22/1984
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|
Title:
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ELECTRON-OPTICAL SYSTEM WITH VARIABLE-SHAPED BEAM FOR GENERATING AND MEASURING MICROSTRUCTURES
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|
|
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Patent #:
|
|
Issue Dt:
|
11/18/1986
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Application #:
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06693231
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Filing Dt:
|
01/22/1985
|
|
Title:
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SAMPLING METHOD FOR FAST POTENTIAL DETERMINATION IN ELECTRON BEAM MENSURATION
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|
|
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Patent #:
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|
Issue Dt:
|
03/17/1987
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Application #:
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06697047
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Filing Dt:
|
01/31/1985
|
|
Title:
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PARTICLE-ACCELERATING ELECTRODE
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|
|
|
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Patent #:
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|
Issue Dt:
|
06/23/1987
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Application #:
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06706105
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Filing Dt:
|
02/27/1985
|
|
Title:
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METHOD FOR AUTOMATICALLY SETTING AN OPERATING POINT GIVEN SIGNAL CURVE MEASUREMENTS WITH A PARTICLE BEAM MEASURING APPARATUS
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|
|
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Patent #:
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|
Issue Dt:
|
12/15/1987
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Application #:
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06751020
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Filing Dt:
|
07/02/1985
|
|
Title:
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SCANNING PARTICLE MICROSCOPE
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|
|
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Patent #:
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|
Issue Dt:
|
11/17/1992
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Application #:
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06753555
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Filing Dt:
|
07/10/1985
|
|
Title:
|
METHOD AND APPARATUS FOR ANALYZING ERRORS IN INTEGRATED CIRCUITS
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|
|
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Patent #:
|
|
Issue Dt:
|
11/10/1987
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Application #:
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06766448
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Filing Dt:
|
08/19/1985
|
|
Title:
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METHOD AND APPARATUS FOR AUTOMATICALLY POSITIONING A PARTICLE BEAM
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|
|
|
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Patent #:
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|
Issue Dt:
|
07/28/1987
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Application #:
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06773863
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Filing Dt:
|
09/09/1985
|
|
Title:
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OPPOSING FIELD SPECTROMETER FOR ELECTRON BEAM MENSURATION TECHNOLOGY
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/29/1988
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Application #:
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06845517
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Filing Dt:
|
03/28/1986
|
|
Title:
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METHOD FOR THE INDIRECT IDENTIFICATION OF THE INTENSITY DISTRIBUTION OF PARTICLE BEAM PULSES GENERATED IN A PARTICLE BEAM MEASURING INSTRUMENT
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|
|
|
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Patent #:
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|
Issue Dt:
|
02/28/1989
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Application #:
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06874498
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Filing Dt:
|
06/16/1986
|
|
Title:
|
SPECTROMETER OBJECTIVE FOR ELECTRON BEAM MENSURATION TECHNIQUES
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/15/1988
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Application #:
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07030964
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Filing Dt:
|
03/27/1987
|
|
Title:
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ELECTROSTATIC-MAGNETIC LENS FOR PARTICLE BEAM APPARATUS
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|
|
|
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Patent #:
|
|
Issue Dt:
|
03/01/1988
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Application #:
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07041654
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Filing Dt:
|
04/21/1987
|
|
Title:
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LOW-ABBERATION SPECTROMETER OBJECTIVE WITH HIGH SECONDARY ELECTRON ACCEPTANCE
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/14/1989
|
Application #:
|
07120133
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Filing Dt:
|
11/13/1987
|
|
Title:
|
SPECTROMETER OBJECTIVE FOR PARTICLE BEAM MEASURING INSTRUMENTS
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/20/1989
|
Application #:
|
07161758
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Filing Dt:
|
02/29/1988
|
|
Title:
|
METHOD FOR TESTING CONDUCTOR NETWORKS
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/15/1990
|
Application #:
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07318970
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Filing Dt:
|
03/06/1989
|
|
Title:
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OBJECTIVE LENS FOR FOCUSING CHARGED PARTICLES IN AN ELECTRON MICROSCOPE
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/20/1991
|
Application #:
|
07419458
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Filing Dt:
|
10/10/1989
|
|
Title:
|
METHOD OF OPERATING AN ELECTRON BEAM MEASURING DEVICE
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/21/1992
|
Application #:
|
07449080
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Filing Dt:
|
12/08/1989
|
|
Title:
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APPARATUS FOR MODULATING A PARTICLE BEAM INTENSITY
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/29/1991
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Application #:
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07612507
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Filing Dt:
|
11/14/1990
|
|
Title:
|
CORPUSCULAR BEAM DEVICE
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|
|
|
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Patent #:
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|
Issue Dt:
|
07/27/1993
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Application #:
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07626944
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Filing Dt:
|
12/13/1990
|
|
Title:
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METHOD AND APPARATUS FOR POTENTIAL MEASUREMENT ON CONDUCTIVE TRACKS OF A PROGRAM-CONTROLLED INTEGRATED CIRCUIT
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/08/1992
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Application #:
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07631472
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Filing Dt:
|
12/20/1990
|
|
Title:
|
ION BEAM DEVICE AND METHOD FOR CARRYING OUT POTENTIAL MEASUREMENTS BY MEANS OF AN ION BEAM
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/25/1993
|
Application #:
|
07744933
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Filing Dt:
|
08/14/1991
|
|
Title:
|
METHOD AND ARRAGEMENT FOR TESTING AND REPAIRING AN INTEGRATED CIRCUIT
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/06/1995
|
Application #:
|
08058959
|
Filing Dt:
|
05/07/1993
|
|
Title:
|
SCANNING ELECTRON BEAM DEVICE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/10/1997
|
Application #:
|
08342743
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Filing Dt:
|
11/21/1994
|
|
Title:
|
METHOD AND APPARATUS FOR PROCESSING A SPECIMEN
|
|
|
|
|
Patent #:
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Issue Dt:
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|
Application #:
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UNAVAILABLE
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Filing Dt:
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Title:
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