Patent Assignment Details
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Reel/Frame: | 008110/0771 | |
| Pages: | 2 |
| | Recorded: | 07/19/1996 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/14/1999
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Application #:
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08684149
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Filing Dt:
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07/19/1996
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Title:
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METHOD OF AND APPARATUS FOR MEASURING FLATNESS OF SEMICONDUCTOR WAFERS THAT HAVE NOT BEEN SUBJECTED TO DONOR-KILLER TREATMENT
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Assignee
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2612, SHINOMIYA, HIRATSUKA-SHI |
KANAGAWA 254, JAPAN |
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Correspondence name and address
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WELSH & KATZ, LTD.
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GERALD T. SHEKLETON, ESQ.
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120 SOUTH RIVERSIDE PLAZA, 22ND FLOOR
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CHICAGO, IL 60603-3913
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