Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 008214/0878 | |
| Pages: | 2 |
| | Recorded: | 11/08/1996 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/10/1998
|
Application #:
|
08701699
|
Filing Dt:
|
08/22/1996
|
|
Title:
|
FAIL ANALYSIS DEVICE FOR SEMICONDUCTOR MEMORY TEST SYSTEM
|
|
|
Assignee
|
|
|
|
|
| NS BUILDING 4-1 NISHI-SHINJUKU, SHINJUKU-KU |
| TOKYO, JAPAN |
|
|
Correspondence name and address
|
| |
KNOBBE, MARTENS, OLSON & BEAR, LLP.
|
| |
YASUO MURAMATSU
|
| |
620 NEWPORT CENTER DRIVE, 16TH FLOOR
|
| |
NEWPORT BEACH, CA 92660
|
Search Results as of:
04/29/2024 02:31 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
