Patent Assignment Details
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Reel/Frame: | 008353/0600 | |
| Pages: | 2 |
| | Recorded: | 01/21/1997 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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03/03/1998
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Application #:
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08736567
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Filing Dt:
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10/23/1996
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Title:
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CHIP DAMAGE DETECTING CIRCUIT FOR SEMICONDUCTOR IC
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Assignee
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2, TAKARA-CHO, KANAGAWA-KU, KANAGAWA |
YOKOHAMA-SHI, JAPAN 221 |
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Correspondence name and address
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FOLEY & LARDNER
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RICHARD L. SCHWAAB
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3000 K STREET, N.W., SUITE 500
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WASHINGTON, DC 20007-5109
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