Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 008513/0498 | |
| Pages: | 4 |
| | Recorded: | 04/04/1997 | | |
| Conveyance: | (ASSIGNMENT OF ASSIGNOR'S INTEREST) RE-RECORD TO CORRECT THE RECORDATION DATE OF 3/4/97 TO 4/4/97 PREVIOUSLY RECORDED AT REEL 8436, FRAME 0706. |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/22/1998
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Application #:
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08748898
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Filing Dt:
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11/15/1996
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Title:
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METHOD AND APPARATUS FOR INSPECTING SLIGHT DEFECTS IN A PHOTOMASK PATTERN
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Assignees
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| 75-1, HASUNUMA-CHO, ITABASHI-KU |
| TOKYO 174, JAPAN |
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| 72, HORIKAWA-CHO, SAIWAI-KU, KAWASAKI-SHI |
| KANAGAWA-KEN 210, JAPAN |
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Correspondence name and address
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FINNEGAN, HENDERSON, FARABOW, ET AL.
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ERNEST F. CHAPMAN
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1300 I STREET, N.W.
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WASHINGTON, D.C. 20005
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