Patent Assignment Details
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| Reel/Frame: | 008722/0703 | |
| Pages: | 3 |
| | Recorded: | 09/18/1997 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/06/1999
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Application #:
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08932894
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Filing Dt:
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09/18/1997
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Title:
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METHOD FOR ACCELERATED TEST OF SEMICONDUCTOR DEVICES
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Assignee
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| 1-1, SAIWAI-CHO, TAKATSUKI-SHI |
| OSAKA 569-11, JAPAN |
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Correspondence name and address
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MERCHANT, GOULD, SMITH, EDELL, ET AL.
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DOUGLAS P. MUELLER
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3100 NORWEST CENTER
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90 SOUTH SEVENTH STREET
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MINNEAPOLIS, MN 55402-4131
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