Patent Assignment Details
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| Reel/Frame: | 008735/0249 | |
| Pages: | 3 |
| | Recorded: | 07/07/1997 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/02/1999
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Application #:
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08888920
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Filing Dt:
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07/07/1997
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Title:
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SEMICONDUCTOR CIRCUIT SYSTEM, METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS, AND METHOD FOR GENERATING A TEST SEQUENCE FOR TESTING THEREOF
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Assignee
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| 1006 OAZA KADOMA, KADOMA-SHI |
| OSAKA 571, JAPAN |
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Correspondence name and address
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MCDERMOTT, WILL & EMERY
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EDWARD E. KUBASIEWICZ, ESQ.
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1850 K STREET, N.W.
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SUITE 450
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WASHINGTON, D.C. 20006-2296
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