Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 008753/0604 | |
| Pages: | 3 |
| | Recorded: | 09/30/1997 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
7
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Patent #:
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Issue Dt:
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08/25/1987
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Application #:
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06725082
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Filing Dt:
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04/19/1985
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Title:
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SEMICONDUCTOR WAFER SCANNING SYSTEM
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Patent #:
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Issue Dt:
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05/31/1988
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Application #:
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06752160
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Filing Dt:
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07/03/1985
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Title:
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METHOD AND APPARATUS FOR DETERMINING SURFACE PROFILES
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Patent #:
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Issue Dt:
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01/06/1987
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Application #:
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06830964
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Filing Dt:
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02/19/1986
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Title:
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CONFOCAL OPTICAL IMAGING SYSTEM WITH IMPROVED SIGNAL-TO-NOISE RATIO
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Patent #:
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Issue Dt:
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11/17/1987
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Application #:
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06850983
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Filing Dt:
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04/11/1986
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Title:
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METHOD AND APPARATUS FOR MEASURING SURFACE PROFILES
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Patent #:
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Issue Dt:
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05/03/1988
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Application #:
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07063474
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Filing Dt:
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06/17/1987
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Title:
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CONFOCAL OPTICAL IMAGING SYSTEM WITH IMPROVED SIGNAL-TO-NOISE RATIO
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Patent #:
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Issue Dt:
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07/11/1989
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Application #:
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07063668
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Filing Dt:
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06/19/1987
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Title:
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METHOD AND APPARATUS FOR READING OR MEASURING MAGNETO-OPTICAL STORAGE MEDIA USING PINHOLE APERTURE
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Patent #:
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Issue Dt:
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02/02/1993
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Application #:
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07719519
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Filing Dt:
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06/24/1991
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Title:
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METHOD AND APPARATUS FOR MEASURING THE DIMENSIONS OF PATTERNED FEATURES ON A LITHOGRAPHIC PHOTOMASK
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Assignee
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| 2-1, OHTEMACHI 2-CHOME CHIYODA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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OBLON, SPIVAK, MCCLELLAND, MAIER, ET AL.
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MARVIN J. SPIVAK
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1755 JEFFERSON DAVIS HWY., FOURTH FLOOR
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ARLINGTON, VIRGINIA 22202
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