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Patent Assignment Details
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Reel/Frame:008964/0517   Pages: 5
Recorded: 02/06/1998
Conveyance: (ASSIGNMENT OF ASSIGNOR'S INTEREST) RECORD TO CORRECT NAME OF ASSIGNORS PREVIOUSLY RECORDED ON REEL 7958, FRAME 793
Total properties: 1
1
Patent #:
Issue Dt:
11/03/1998
Application #:
08612750
Filing Dt:
03/08/1996
Title:
TEST BOARD FOR TESTING A SEMICONDUCTOR DEVICE, METHOD OF TESTING THE SEMICONDUCTOR DEVICE, CONTACT DEVICE, TEST METHOD USING THE CONTACT DEVICE, AND TEST JIG FOR TESTING THE SEMICONDUCTOR DEVICE
Assignors
1
Exec Dt:
05/07/1996
2
Exec Dt:
05/07/1996
3
Exec Dt:
05/07/1996
4
Exec Dt:
05/07/1996
5
Exec Dt:
05/07/1996
6
Exec Dt:
05/07/1996
7
Exec Dt:
05/07/1996
8
Exec Dt:
05/07/1996
9
Exec Dt:
05/07/1996
Assignee
1
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU
KAWASAKI-SHI, KANAGAWA, JAPAN 211
Correspondence name and address
ARMSTRONG, WESTERMAN, HATTORI, ET AL.
GAY ANN SPAHN
1725 K STREET, SUITE 1000
WASHINGTON, D.C. 20006

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