Patent Assignment Details
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| Reel/Frame: | 009566/0252 | |
| Pages: | 4 |
| | Recorded: | 11/06/1998 | | |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR'S NAME PREVIOUSLY RECORDED ON REEL 9319, FRAME 0733. |
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Total properties:
1
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Patent #:
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Issue Dt:
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05/16/2000
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Application #:
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09030349
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Filing Dt:
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02/25/1998
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Title:
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SEMICONDUCTOR WAFER TESTING METHOD WITH PROBE PIN CONTACT T
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Assignee
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| KAWASAKI-SHI |
| 1-1, KAMIKODANAKA 4-CHOME NAKAHARA-KU |
| KANAGAWA 211-8588, JAPAN |
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Correspondence name and address
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ARMSTRONG, WESTERMAN, HATTORI, ET AL.
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WILLIAM F. WESTERMAN
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1725 K STREET, N.W.
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SUITE 1000
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WASHINGTON, D.C. 20006
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