Patent Assignment Details
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| Reel/Frame: | 009578/0871 | |
| Pages: | 3 |
| | Recorded: | 11/03/1998 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/16/2002
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Application #:
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09185184
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Filing Dt:
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11/03/1998
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Title:
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FAILURE ANALYSIS MEMORY FOR SEMICONDUCTOR MEMORY TESTING DEVICES AND ITS STORAGE METHOD
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Assignee
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| 32-1, ASAHICHO 1-CHOME NERIMA-KU |
| TOKYO 179-0071, JAPAN |
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Correspondence name and address
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GALLAGHER & LATHROP
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DAVID N. LATHROP, ESQUIRE
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A PROFESSIONAL CORPORATION
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601 CALIFORNIA STREET, SUITE 1111
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SAN FRANCISCO, CA 94108-2805
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