Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 009674/0674 | |
| Pages: | 2 |
| | Recorded: | 12/18/1998 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
Total properties:
1
|
|
Patent #:
|
|
Issue Dt:
|
01/16/2001
|
Application #:
|
09185428
|
Filing Dt:
|
11/03/1998
|
Title:
|
METHOD OF DETECTING MICROSCOPIC DEFECTS EXISTING ON A SILICON WAFER
|
|
Assignees
|
|
|
2612, SHINOMIYA, HIRATSUKA-SHI |
KANAGAWA, JAPAN |
|
|
|
2612, SHINOMIYA, HIRATSUKA-SHI |
STANFORD, CALIFORNIA 94305 |
|
Correspondence name and address
|
|
WELSH & KATZ, LTD.
|
|
GERALD T. SHEKLETON, ESQ.
|
|
120 SOUTH RIVERSIDE PLAZA/ 22ND FLOOR
|
|
CHICAGO, ILLINOIS 60603-3913
|
Search Results as of:
04/19/2024 02:15 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|