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Patent Assignment Details
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Reel/Frame:009836/0661   Pages: 3
Recorded: 03/22/1999
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
04/02/2002
Application #:
09162267
Filing Dt:
09/29/1998
Title:
APPARATUS AND METHOD FOR CONTACT FAILURE INSPECTION IN SEMICONDUCTOR DEVICES
Assignors
1
Exec Dt:
12/11/1998
2
Exec Dt:
02/26/1999
3
Exec Dt:
12/11/1998
4
Exec Dt:
12/11/1998
Assignee
1
416, MAETAN-DONG, PALDAL-GU
SUWON-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF
Correspondence name and address
LAPPIN & KUSMER LLP
STEVEN M. MILLS, ESQ.
200 STATE STREET
BOSTON, MA 02109

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