Patent Assignment Details
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| Reel/Frame: | 010042/0542 | |
| Pages: | 3 |
| | Recorded: | 06/21/1999 | | |
| Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/02/2002
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Application #:
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09228178
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Filing Dt:
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01/11/1999
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Publication #:
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Pub Dt:
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03/14/2002
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Title:
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SYSTEM AND METHOD FOR DETERMINING YIELD IMPACT FOR SEMICONDUCTOR DEVICES
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Assignee
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| 1730 NORTH FIRST STREET |
| SAN JOSE, CALIFORNIA 95112 |
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Correspondence name and address
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SIEMENS CORPORATION
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ELSA KELLER
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186 WOOD AVENUE SOUTH
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ISELIN, NJ 08830
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