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Total properties:
25
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Patent #:
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Issue Dt:
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03/07/1989
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Application #:
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06838319
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Filing Dt:
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03/10/1986
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Title:
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METHOD AND APPARATUS FOR DETECTING DEFECT INFORMATION IN A HOLOGRAPHIC IMAGE PATTERN
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Patent #:
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Issue Dt:
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12/22/1987
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Application #:
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06895310
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Filing Dt:
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08/11/1986
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Title:
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ARRANGEMENT FOR DETECTING SECONDARY AND/OR BACKSCATTER ELECTRONS IN AN ELECTRON BEAM APPARATUS
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Patent #:
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Issue Dt:
|
05/16/1989
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Application #:
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07130028
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Filing Dt:
|
12/08/1987
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Title:
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DETECTOR OBJECTIVE FOR PARTICLE BEAM APPARATUS
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Patent #:
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Issue Dt:
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01/23/1990
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Application #:
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07150245
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Filing Dt:
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01/29/1988
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Title:
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DETECTOR OBJECTIVE FOR SCANNING MICROSCOPES
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Patent #:
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Issue Dt:
|
07/17/1990
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Application #:
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07312619
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Filing Dt:
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02/17/1989
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Title:
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SYSTEM FOR MEASURING A TOPOGRAPHICAL FEATURE ON A SPECIMEN
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Patent #:
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Issue Dt:
|
09/04/1990
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Application #:
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07416996
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Filing Dt:
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10/02/1989
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Title:
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METHOD FOR EXAMINING A SPECIMEN IN A PARTICLE BEAM INSTRUMENT
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Patent #:
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Issue Dt:
|
06/04/1991
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Application #:
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07463543
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Filing Dt:
|
01/11/1990
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Title:
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MULTIPOLE ELEMENT
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Patent #:
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Issue Dt:
|
12/15/1992
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Application #:
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07608208
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Filing Dt:
|
11/02/1990
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Title:
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SPATIAL FILTER FOR OPTICALLY BASED DEFECT INSPECTION SYSTEM
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|
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Patent #:
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Issue Dt:
|
06/09/1992
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Application #:
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07613208
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Filing Dt:
|
11/14/1990
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Title:
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INSPECTION SYSTEM FOR ARRAY OF MICROCIRCUIT DIES HAVING REDUNDANT CIRCUIT PATTERNS
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Patent #:
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Issue Dt:
|
09/08/1992
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Application #:
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07691238
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Filing Dt:
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04/25/1991
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Title:
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PARTICLE BEAM APPARATUS HAVING AN IMMERSION LENS ARRANGED IN AN INTERMEDIATE IMAGE OF THE BEAM
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Patent #:
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Issue Dt:
|
12/16/1997
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Application #:
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07790871
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Filing Dt:
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11/12/1991
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Title:
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TWO-PHASE OPTICAL INSPECTION METHOD AND APPARATUS FOR DEFECT DETECTION
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Patent #:
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Issue Dt:
|
04/08/1997
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Application #:
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07801761
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Filing Dt:
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11/27/1991
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Title:
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APPARATUS AND METHOD FOR INSPECTION OF A PATTERNED OBJECT BY COMPARISON THEREOF TO A REFERENCE
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|
|
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Patent #:
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Issue Dt:
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12/17/1996
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Application #:
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07880100
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Filing Dt:
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04/21/1992
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Title:
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APPARATUS AND METHOD FOR INSPECION OF A PATTERNED OBJECT BY COMPARISM THEREOF TO A REFERENCE
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|
|
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Patent #:
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Issue Dt:
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05/10/1994
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Application #:
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07909340
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Filing Dt:
|
07/06/1992
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|
Title:
|
METHOD AND APPARATUS FOR DETECTING SURFACE DEVIATIONS FROM A REFERENCE PLANE
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|
|
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Patent #:
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|
Issue Dt:
|
07/12/1994
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Application #:
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07974267
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Filing Dt:
|
11/10/1992
|
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Title:
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DEVICE FOR CORPUSCULAR-OPTICAL EXAMINATION AND/OR PROCESSING OF MATERIAL SAMPLES
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|
|
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Patent #:
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|
Issue Dt:
|
04/08/1997
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Application #:
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08097971
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Filing Dt:
|
07/26/1993
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|
Title:
|
APPARATUS & METHOD FOR COMPARING AND ALIGNING TWO DIGITAL REPRESENTATIONS OF AN IMAGE
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|
|
|
|
Patent #:
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|
Issue Dt:
|
06/27/1995
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Application #:
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08130281
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Filing Dt:
|
09/30/1993
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Title:
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INSPECTION SYSTEM WITH IN-LENS, OFF-AXIS ILLUMINATOR
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|
|
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Patent #:
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|
Issue Dt:
|
11/14/1995
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Application #:
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08262285
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Filing Dt:
|
06/20/1994
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Title:
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ELECTRON DETECTOR WITH HIGH BACKSCATTERED ELECTRON ACCEPTANCE FOR PARTICLE BEAM APPARATUS
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|
|
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Patent #:
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Issue Dt:
|
07/01/1997
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Application #:
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08579125
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Filing Dt:
|
12/27/1995
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Title:
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SYSTEM FOR HIGH RESOLUTION IMAGING AND MEASUREMENT OF TOPOGRAPHIC AND MATERIAL FEATURES ON A SPECIMEN
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|
|
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Patent #:
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Issue Dt:
|
08/19/1997
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Application #:
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08606363
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Filing Dt:
|
02/23/1996
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Title:
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RELIABLE DEFECT DETECTION USING MULTIPLE PERSPECTIVE SCANNING ELECTRON MICROSCOPE IMAGES
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|
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Patent #:
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|
Issue Dt:
|
05/25/1999
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Application #:
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08701485
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Filing Dt:
|
08/22/1996
|
|
Title:
|
APPARATUS AND METHOD FOR COMPARING AND ALIGNING TWO DIGITAL REPRESENTATIONS OF AN IMAGE
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|
|
|
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Patent #:
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|
Issue Dt:
|
08/25/1998
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Application #:
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08818312
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Filing Dt:
|
03/14/1997
|
|
Title:
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UNIVERSAL CHUCK FOR HOLDING PLATES OF VARIOUS SIZES
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|
|
|
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Patent #:
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|
Issue Dt:
|
04/06/1999
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Application #:
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08843453
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Filing Dt:
|
04/16/1997
|
|
Title:
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OPTICAL INSPECTION METHOD AND APPARATUS
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
12/29/1998
|
Application #:
|
08865380
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Filing Dt:
|
05/29/1997
|
|
Title:
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A METHOD OF HIGH SPEED, HIGH DETECTION SENSITIVITY INSPECTION OF REPETITIVE AND RANDOM SPECIMENT PATTERNS
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|
|
|
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Patent #:
|
|
Issue Dt:
|
11/09/1999
|
Application #:
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08984558
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Filing Dt:
|
12/03/1997
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|
Title:
|
OPTICAL INSPECTION METHOD AND APPARATUS
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