Patent Assignment Details
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| Reel/Frame: | 010932/0457 | |
| Pages: | 7 |
| | Recorded: | 06/27/2000 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/29/2003
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Application #:
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09543192
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Filing Dt:
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04/05/2000
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Title:
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METHOD FOR THE DETECTION OF PROCESSING-INDUCED DEFECTS IN A SILICON WAFER
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Assignee
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| P.O. BOX 8 |
| 501 PEARL DRIVE |
| ST. PETERS, MISSOURI 63376 |
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Correspondence name and address
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SENNIGER, POWERS, LEAVITT & ROEDEL
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EDWARD J. HEJLEK
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ONE METROPOLITAN SQUARE, 16TH FLOOR
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ST. LOUIS, MISSOURI 63102
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