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Total properties:
14
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Patent #:
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Issue Dt:
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07/23/1991
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Application #:
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07438779
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Filing Dt:
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11/17/1989
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Title:
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DOUBLE PASS TANDEM COOLING AEROSOL CONDENSER
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Patent #:
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Issue Dt:
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08/03/1993
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Application #:
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07750976
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Filing Dt:
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08/28/1991
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Title:
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HIGH SOLIDS CONTENT SAMPLE TORCHES AND METHOD OF USE
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Patent #:
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Issue Dt:
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11/09/1993
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Application #:
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07766049
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Filing Dt:
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09/25/1991
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Title:
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SAMPLE INTRODUCTION SYSTEM FOR INDUCTIVELY COUPLED PLASMA AND OTHER GAS-PHASE, OR PARTICLE, DETECTORS UTILIZING ULTRASONIC NEBULIZATION, AND METHOD OF USE.
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Patent #:
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Issue Dt:
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05/18/1993
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Application #:
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07813766
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Filing Dt:
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12/27/1991
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Title:
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DIRECT INJECTION MICRO NEBULIZER SYSTEM AND METHOD OF USE
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Patent #:
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Issue Dt:
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12/21/1993
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Application #:
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07980467
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Filing Dt:
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11/23/1992
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Title:
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DIRECT INJECTION MICRO NEBULIZER AND ENCLOSED FILTER SOLVENT REMOVAL SAMPLE INTRODUCTION SYSTEM, AND METHOD OF USE
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Patent #:
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Issue Dt:
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03/28/1995
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Application #:
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08025665
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Filing Dt:
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03/03/1993
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Title:
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SAMPLE INTRODUCTION SYSTEM FOR INDUCTIVELY COUPLED PLASMA AND OTHER GAS-PHASE, OR PARTICLE, DETECTORS UTILIZING AN ENCLOSED FILTER SOLVENT REMOVAL SYSTEM, AND METHOD OF USE
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Patent #:
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Issue Dt:
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10/03/1995
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Application #:
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08177219
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Filing Dt:
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01/04/1994
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Title:
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A SYSTEM FOR GENERATING AND PROVIDING A GASEOUS PHASE SAMPLE AT RELATIVELY SEQUENTIALLY CONSTANT PRESSURE AND FLOW RATE
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Patent #:
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Issue Dt:
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04/04/1995
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Application #:
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08177256
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Filing Dt:
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01/04/1994
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Title:
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SYSTEM FOR ENHANCING DETECTION OF SAMPLE COMPONENTS IN PLASMA BASED SAMPLE ANALYSIS SYSTEMS, AND METHOD OF USE
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Patent #:
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Issue Dt:
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10/03/1995
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Application #:
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08247872
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Filing Dt:
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05/23/1994
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Title:
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SEQUENTIAL COMBINATION LOW TEMPERATURE CONDENSER AND ENCLOSED FILTER SOLVENT REMOVAL SYSTEM, AND METHOD OF USE
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Patent #:
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Issue Dt:
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08/11/1998
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Application #:
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08722781
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Filing Dt:
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09/27/1996
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Title:
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HIGH EFFICIENCY CONTINUOUS FLOW THROUGH FRACTIONAL-VOLATILIZATION SEPARATOR SYSTEM, AND METHOD OF USE
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Patent #:
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Issue Dt:
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09/29/1998
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Application #:
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08944280
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Filing Dt:
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10/06/1997
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Title:
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LONG-PATH ABSORBANCE-CELL IMAGING SYSTEM WITH DECREASED SYSTEM ELEMENT PARAMETER CHANGE BASED SENSITIVITY AND METHOD OF USE
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Patent #:
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Issue Dt:
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12/14/1999
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Application #:
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09044672
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Filing Dt:
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03/20/1998
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Title:
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SYSTEM AND METHOD OF DETERMINING TRACE ELEMENTS IN HIGH VISCOSITY LIQUIDS, AND POWDERS, UTILIZING LASER-ABLATION
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Patent #:
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Issue Dt:
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12/14/1999
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Application #:
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09144893
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Filing Dt:
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09/01/1998
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Title:
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SYSTEM AND METHOD FOR PRODUCING NEBULIZED SAMPLE ANALYTE CONTAINING SOLUTION FOR INTRODUCTION TO SAMPLE ANALYSIS SYSTEMS
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Patent #:
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Issue Dt:
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04/30/2002
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Application #:
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09318402
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Filing Dt:
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05/25/1999
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Title:
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METHOD AND SYSTEM FOR IDENTIFYING ETCH END POINTS IN SEMICONDUCTOR CIRCUIT FABRICATION
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