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Patent Assignment Details
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Reel/Frame:011311/0164   Pages: 3
Recorded: 12/05/2000
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
07/22/2003
Application #:
09644069
Filing Dt:
08/23/2000
Title:
APPARATUS METHOD OF INSPECTING FOREIGN PARTICLE OR DEFECT ON A SAMPLE
Assignors
1
Exec Dt:
11/10/2000
2
Exec Dt:
11/10/2000
3
Exec Dt:
11/13/2000
4
Exec Dt:
11/13/2000
5
Exec Dt:
11/25/2000
6
Exec Dt:
11/13/2000
7
Exec Dt:
11/13/2000
8
Exec Dt:
11/16/2000
9
Exec Dt:
11/16/2000
Assignees
1
6, KANDA SURUGADAI 4-CHOME
CHIYODA-KU, TOKYO, JAPAN
2
16-3, HIGASHI 3-CHOME
SHIBUYA-KU, TOKYO, JAPAN
Correspondence name and address
ATSK, LLP
MELVIN KRAUS
1300 NORTH 17TH STREET
SUITE 1800
ARLINGTON, VA 22209

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