Patent Assignment Details
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Reel/Frame: | 011349/0099 | |
| Pages: | 3 |
| | Recorded: | 12/06/2000 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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09731218
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Filing Dt:
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12/06/2000
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Publication #:
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Pub Dt:
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06/07/2001
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Title:
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METHOD AND APPARATUS FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT WITH BURN-IN AND BIST TESTING CAPABILITIES
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Assignee
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7-1, SHIBA 5-CHOME |
MINATO-KU, JAPAN |
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Correspondence name and address
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HELFGOTT & KARAS, P.C.
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AARON B. KARAS
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EMPIRE STATE BUILDING
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60TH FLOOR
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NEW YORK, NEW YORK,10118
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