Patent Assignment Details
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Reel/Frame: | 011389/0209 | |
| Pages: | 4 |
| | Recorded: | 12/15/2000 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/28/2003
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Application #:
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09738553
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Filing Dt:
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12/15/2000
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Publication #:
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Pub Dt:
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05/03/2001
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Title:
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METHOD FOR TESTING SEMICONDUCTOR DEVICES
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Assignees
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2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU |
TOKYO, JAPAN 100-8 |
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20-4, SHOTO 2-CHOME, SHIBUYA-KU |
TOKYO, JAPAN 150-0 |
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Correspondence name and address
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LEYDIG, VOIT & MAYER, LTD.
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JEFFREY A. WYAND
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700 13TH ST., NW - SUITE 300
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WASHINGTON, DC 20005-3960
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