Patent Assignment Details
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| Reel/Frame: | 011653/0537 | |
| Pages: | 2 |
| | Recorded: | 03/22/2001 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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10/30/2001
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Application #:
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09813917
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Filing Dt:
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03/22/2001
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Title:
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Semiconductor integrated circuit device including tester circuit for defective memory cell replacement
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Assignee
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| 2-3, MARUNOUCHI 2-CHOME CHIYODA-KU |
| TOKYO 100-8310, JAPAN |
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Correspondence name and address
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MCDERMOTT, WILL & EMERY
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STEPHEN A. BECKER
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600 13TH STREET, N.W.
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WASHINGTON, D.C. 20005
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