Patent Assignment Details
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| Reel/Frame: | 011905/0719 | |
| Pages: | 3 |
| | Recorded: | 06/06/2001 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/27/2007
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Application #:
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09876389
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Filing Dt:
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06/06/2001
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Publication #:
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Pub Dt:
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03/21/2002
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Title:
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METHOD AND APPARATUS FOR GENERATING TEST PATTERNS USED IN TESTING SEMICONDUCTOR INTEGRATED CIRUIT
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Assignee
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| 32-1, ASAHICHO 1-CHOME, NERIMA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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GALLAGHER & LATHROP
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DAVID N. LATHROP, ESQUIRE
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601 CALIFORNIA STREET
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SUITE 1111
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SAN FRANCISCO, CA 94108-2805
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