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Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:012036/0461   Pages: 9
Recorded: 07/31/2001
Conveyance: CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNMENT, PREVIOUSLY RECORDED AT REEL 10871 FRAME 0492.
Total properties: 14
1
Patent #:
Issue Dt:
03/07/1989
Application #:
06838319
Filing Dt:
03/10/1986
Title:
METHOD AND APPARATUS FOR DETECTING DEFECT INFORMATION IN A HOLOGRAPHIC IMAGE PATTERN
2
Patent #:
Issue Dt:
12/22/1987
Application #:
06895310
Filing Dt:
08/11/1986
Title:
ARRANGEMENT FOR DETECTING SECONDARY AND/OR BACKSCATTER ELECTRONS IN AN ELECTRON BEAM APPARATUS
3
Patent #:
Issue Dt:
05/16/1989
Application #:
07130028
Filing Dt:
12/08/1987
Title:
DETECTOR OBJECTIVE FOR PARTICLE BEAM APPARATUS
4
Patent #:
Issue Dt:
01/23/1990
Application #:
07150245
Filing Dt:
01/29/1988
Title:
DETECTOR OBJECTIVE FOR SCANNING MICROSCOPES
5
Patent #:
Issue Dt:
07/17/1990
Application #:
07312619
Filing Dt:
02/17/1989
Title:
SYSTEM FOR MEASURING A TOPOGRAPHICAL FEATURE ON A SPECIMEN
6
Patent #:
Issue Dt:
09/04/1990
Application #:
07416996
Filing Dt:
10/02/1989
Title:
METHOD FOR EXAMINING A SPECIMEN IN A PARTICLE BEAM INSTRUMENT
7
Patent #:
Issue Dt:
06/04/1991
Application #:
07463543
Filing Dt:
01/11/1990
Title:
MULTIPOLE ELEMENT
8
Patent #:
Issue Dt:
12/15/1992
Application #:
07608208
Filing Dt:
11/02/1990
Title:
SPATIAL FILTER FOR OPTICALLY BASED DEFECT INSPECTION SYSTEM
9
Patent #:
Issue Dt:
06/09/1992
Application #:
07613208
Filing Dt:
11/14/1990
Title:
INSPECTION SYSTEM FOR ARRAY OF MICROCIRCUIT DIES HAVING REDUNDANT CIRCUIT PATTERNS
10
Patent #:
Issue Dt:
09/08/1992
Application #:
07691238
Filing Dt:
04/25/1991
Title:
PARTICLE BEAM APPARATUS HAVING AN IMMERSION LENS ARRANGED IN AN INTERMEDIATE IMAGE OF THE BEAM
11
Patent #:
Issue Dt:
07/12/1994
Application #:
07974267
Filing Dt:
11/10/1992
Title:
DEVICE FOR CORPUSCULAR-OPTICAL EXAMINATION AND/OR PROCESSING OF MATERIAL SAMPLES
12
Patent #:
Issue Dt:
06/27/1995
Application #:
08130281
Filing Dt:
09/30/1993
Title:
INSPECTION SYSTEM WITH IN-LENS, OFF-AXIS ILLUMINATOR
13
Patent #:
Issue Dt:
12/29/1998
Application #:
08865380
Filing Dt:
05/29/1997
Title:
A METHOD OF HIGH SPEED, HIGH DETECTION SENSITIVITY INSPECTION OF REPETITIVE AND RANDOM SPECIMENT PATTERNS
14
Patent #:
Issue Dt:
11/09/1999
Application #:
08984558
Filing Dt:
12/03/1997
Title:
OPTICAL INSPECTION METHOD AND APPARATUS
Assignor
1
Exec Dt:
05/12/2000
Assignee
1
P.O. BOX 450A
SANTA CLARA, CALIFORNIA 95052
Correspondence name and address
APPLIED MATERIALS, INC.
JANE I. SONG
ATTN: PATENT GROUP
2881 SCOTT BLVD., M/S 2061
SANTA CLARA, CA 95050

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