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Patent Assignment Details
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Reel/Frame:012297/0009   Pages: 5
Recorded: 11/02/2001
Conveyance: CORRECTIVE DOCUMENT FOR THIRD INVENTOR'S LAST NAME
Total properties: 1
1
Patent #:
Issue Dt:
06/25/2002
Application #:
09906675
Filing Dt:
07/18/2001
Publication #:
Pub Dt:
03/14/2002
Title:
SEMICONDUCTOR SUBSTRATE TEST DEVICE AND METHOD
Assignors
1
Exec Dt:
07/02/2001
2
Exec Dt:
07/02/2001
3
Exec Dt:
07/02/2001
4
Exec Dt:
07/02/2001
Assignee
1
NAKAHARA-KU
1-1 KAMIKODANAKA 4-CHOME
KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Correspondence name and address
ARMSTRONG, WESTERMAN, HATTORI ETAL
WILLIAM G. KRATZ, JR
1725 K STREET NW SUITE 1000
WASHINGTON, D.C. 20006

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