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Reel/Frame:012319/0173   Pages: 7
Recorded: 11/20/2001
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
6624031
Issue Dt:
09/23/2003
Application #:
09989850
Filing Dt:
11/20/2001
Publication #:
US20030094608
Pub Dt:
05/22/2003
Title:
TEST STRUCTURE AND METHODOLOGY FOR SEMICONDUCTOR STRESS-INDUCED DEFECTS AND ANTIFUSE BASED ON SAME TEST STRUCTURE
Assignors
1
ABADEER, WAGDI W.
Exec Dt:
11/13/2001
2
ADLER, ERIC
Exec Dt:
11/14/2001
3
BROWN, JEFFREY S.
Exec Dt:
11/14/2001
4
GAUTHIER, ROBERT J., JR.
Exec Dt:
11/14/2001
5
MCKENNA, JONATHAN M.
Exec Dt:
11/19/2001
6
RANKIN, JED H.
Exec Dt:
11/14/2001
7
SENGLE, EDWARD W.
Exec Dt:
11/14/2001
8
TONTI, WILLIAM R.
Exec Dt:
11/14/2001
Assignee
1
INTERNATIONAL BUSINESS MACHINES CORPORATION
NEW ORCHARD ROAD
ARMONK, NEW YORK 10504
Correspondence name and address
SCHMEISER, OLDEN & WATTS
HOWARD J. WALTER, JR.
SUITE 301, 3 LEAR JET
LATHAM, NY 12033

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