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Patent Assignment Details
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Reel/Frame:012415/0252   Pages: 2
Recorded: 12/27/2001
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
03/14/2006
Application #:
10026560
Filing Dt:
12/27/2001
Publication #:
Pub Dt:
12/12/2002
Title:
TEST METHOD AND TEST SYSTEM FOR SEMICONDUCTOR DEVICE
Assignors
1
Exec Dt:
12/12/2001
2
Exec Dt:
12/12/2001
3
Exec Dt:
12/12/2001
Assignee
1
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU
KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Correspondence name and address
ARENT FOX KINTNER PLOTKIN & KAHN PLLC
CHARLES M. MARMELSTEIN
1050 CONNECTICUT AVENUE, N.W., SUITE 400
WASHINGTON, D.C. 20036-5339

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