Patent Assignment Details
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| Reel/Frame: | 012659/0886 | |
| Pages: | 2 |
| | Recorded: | 02/26/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10083447
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Filing Dt:
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02/26/2002
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Publication #:
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Pub Dt:
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09/05/2002
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Title:
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METHOD OF TESTING A SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD AND APPARATUS FOR GENERATING TEST PATTERNS
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Assignee
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| MINATO-KU |
| 7-1, SHIBA 5-CHOME |
| TOKYO, JAPAN |
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Correspondence name and address
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ROSENMAN & COLIN, LLP
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MICHAEL I. MARKOWITZ
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575 MADISON AVENNUE
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15TH FLOOR IP DEPARTMENT
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NEW YORK, NY 10022-2585
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