Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 012708/0021 | |
| Pages: | 5 |
| | Recorded: | 03/19/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/06/2007
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Application #:
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10039290
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Filing Dt:
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01/04/2002
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Publication #:
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Pub Dt:
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09/12/2002
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Title:
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SUBMICRON THERMAL IMAGING METHOD AND ENHANCED RESOLUTION (SUPER-RESOLVED) AC-COUPLED IMAGING FOR THERMAL INSPECTION OF INTEGRATED CIRCUITS
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Assignee
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| 12TH FLOOR |
| 1111 FRANKLIN STREET |
| OAKLAND, CALIFORNIA 94607 |
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Correspondence name and address
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O'BANION & RICHEY LLP
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JOHN P. O'BANION
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400 CAPITOL MALL
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SUITE 1550
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SACRAMENTO, CA 95814
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