Patent Assignment Details
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| Reel/Frame: | 012827/0746 | |
| Pages: | 3 |
| | Recorded: | 04/18/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/20/2004
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Application #:
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10125248
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Filing Dt:
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04/18/2002
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Publication #:
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Pub Dt:
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10/24/2002
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Title:
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PROBE STRUCTURE FOR TESTING SEMICONDUCTOR DEVICES AND METHOD FOR FABRICATING THE SAME
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Assignee
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| INTER-UNIVERSITY SEMICONDUCTOR RESEARCH CENTER (MAIN BUILDING), SEOUL NATIONAL UNIVERSITY |
| SAN 56-1, SHINLIM-DONG, GWANAK-GU |
| SEOUL 151-742, KOREA, REPUBLIC OF |
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Correspondence name and address
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HEAD, JOHNSON & KACHIGIAN
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MARK G. KACHIGIAN
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228 WEST 17TH PLACE
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TULSA, OK 74119
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