Patent Assignment Details
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| Reel/Frame: | 012849/0637 | |
| Pages: | 3 |
| | Recorded: | 04/26/2002 | | |
| Conveyance: | INVALID ASSIGNMENT: SEE RECORDING AT REEL 012942 FRAME 0434. RE-RECORD TO CORRECT RECORDATION DATE FROM 4-26-02 TO 4-29-02. |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10133483
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Filing Dt:
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04/29/2002
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Publication #:
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Pub Dt:
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05/01/2003
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Title:
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Semiconductor device having test element and method of testing using same
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Assignee
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| 2-3, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO 100-8310, JAPAN |
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Correspondence name and address
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OBLON, SPIVAK, MCCLELLAND, ET AL.
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MARVIN J. SPIVAK
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1755 JEFFERSON DAVIS HWY., FOURTH FLOOR
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ARLINGTON, VIRGINIA 22202
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