Patent Assignment Details
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Reel/Frame: | 012942/0434 | |
| Pages: | 3 |
| | Recorded: | 04/26/2002 | | |
Conveyance: | INVALID RECORDING: RE-RECORD TO CORRECT THE RECORDATION DATE OF 4-26-02 TO 4-29-02 PREVIOUSLY RECORDED AT REEL 013034, FRAME 0692. |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10133483
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Filing Dt:
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04/29/2002
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Publication #:
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Pub Dt:
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05/01/2003
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Title:
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Semiconductor device having test element and method of testing using same
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Assignee
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CHIYODA-KU |
2-3, MARUNOUCHI 2-CHOME |
TOKYO, JAPAN 100-8 |
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Correspondence name and address
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OBLON SPIVAK MCCLELLAND MAIER & NEUSTADT
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FOURTH FLOOR
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1755 JEFFERSON DAVIS HIGHWAY
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ARLINGTON, VA 22202
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