Patent Assignment Details
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| Reel/Frame: | 013022/0990 | |
| Pages: | 3 |
| | Recorded: | 06/20/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/28/2006
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Application #:
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10175076
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Filing Dt:
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06/20/2002
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Publication #:
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Pub Dt:
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12/26/2002
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Title:
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METHOD FOR EVALUATING DEPENDENCE OF PROPERTIES OF SEMICONDUCTOR SUBSTRATE ON PLANE ORIENTATION AND SEMICONDUCTOR DEVICE USING THE SAME
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Assignees
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| OSAKA-SHI |
| 22-22, NAGAIKE-CHO, ABENO-KU |
| OSAKA, JAPAN 545-8 |
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| AOBA-KU |
| 2-33-18, HIGASHIKATSUYAMA |
| SENDAI-SHI MIYAGI, JAPAN 981-0 |
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Correspondence name and address
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NIXON & VANDERHYE P.C.
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H. WARREN BURNAM, JR.
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1100 NORTH GLEBE ROAD
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8TH FLOOR
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ARLINGTON, VA 22201
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