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Reel/Frame:013075/0784   Pages: 2
Recorded: 07/12/2002
Conveyance: CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
11/17/1998
Application #:
08732068
Filing Dt:
10/16/1996
Title:
USE OF FOCUSED ION AND ELECTRON BEAMS FOR FABRICATING A SENSOR ON A PROBE TIP USED FOR SCANNING MULTIPROBE MICROSCOPY AND THE LIKE
Assignor
1
Exec Dt:
03/26/2002
Assignee
1
OFFICE OF THE GENERAL COUNSEL, SUITE 1265
4201 WILSON BOULEVARD
ARLINGTON, VIRGINIA 22230
Correspondence name and address
ROBIN CLAY FRITSCH
OFFICE OF THE GENERAL COUNSEL
4201 WILSON BOULEVARD,
SUITE 1265
ARLINGTON, VA 22230

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