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Patent Assignment Details
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Reel/Frame:013087/0575   Pages: 3
Recorded: 07/03/2002
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
02/22/2005
Application #:
10190420
Filing Dt:
07/03/2002
Title:
TEST STRUCTURE FOR MEASURING EFFECT OF TRENCH ISOLATION ON OXIDE IN A MEMORY DEVICE
Assignors
1
Exec Dt:
06/11/2002
2
Exec Dt:
06/11/2001
3
Exec Dt:
06/17/2002
Assignee
1
ONE AMD PLACE, P.O. BOX 3453
SUNNYVALE, CALIFORNIA 94088
Correspondence name and address
WAGNER, MURABITO & HAO LLP
JAMES P. HAO
TWO NORTH MARKET STREET
THIRD FLOOR
SAN JOSE, CA 95113

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