Patent Assignment Details
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| Reel/Frame: | 013112/0884 | |
| Pages: | 2 |
| | Recorded: | 07/17/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/30/2004
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Application #:
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10196146
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Filing Dt:
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07/17/2002
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Publication #:
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Pub Dt:
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03/27/2003
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Title:
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INSPECTION DATA ANALYSIS PROGRAM, DEFECT INSPECTION APPARATUS, DEFECT INSPECTION SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE
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Assignee
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| 6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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ANTONELLI, TERRY, STOUT & KRAUS, LLP
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MELVIN KRAUS
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1300 NORTH 17TH ST., STE. 1800
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ARLINGTON, VA 22209
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