Patent Assignment Details
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| Reel/Frame: | 013116/0933 | |
| Pages: | 5 |
| | Recorded: | 07/24/2002 | | |
| Conveyance: | RE-RECORD TO CORRECT THE SPELLING OF THE NAME OF THE ASSIGNEE, PREVIOUSLY RECORDED ON REEL 012289 FRAME 0845, ASSIGNOR CONFIRMS THE ASSIGNMENT OF THE ENTIRE INTEREST. |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/29/2003
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Application #:
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09936920
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Filing Dt:
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09/20/2001
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Publication #:
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Pub Dt:
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01/23/2003
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Title:
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SILICON WAFER, METHOD FOR DETERMINING PRODUCTION CONDITIONS OF SILICON SINGLE CRYSTAL AND METHOD FOR PRODUCING SILICON WAFER
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Assignee
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| 4-2, MARUNOUCHI 1-CHOME, CHIYODA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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OLIFF & BERRIDGE, PLC
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WILLIAM P. BERRIDGE
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P.O. BOX 19928
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ALEXANDRIA, VIRGINIA 22320
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