Patent Assignment Details
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| Reel/Frame: | 013165/0586 | |
| Pages: | 2 |
| | Recorded: | 07/29/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10208110
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Filing Dt:
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07/29/2002
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Publication #:
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Pub Dt:
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10/02/2003
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Title:
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Compacted test plan generation for integrated circuit testing, test sequence generation, and test
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Assignee
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| 17-2, SHIN YOKOHAMA 3-CHOME, KOUHOKU-KU |
| YOKOHAMA-SHI, KANAGAWA 222-0033, JAPAN |
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Correspondence name and address
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CHRISTIE, PARKER & HALE, LLP
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D. BRUCE PROUT
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P.O. BOX 7068
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PASADENA, CA 91109-7068
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