Patent Assignment Details
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| Reel/Frame: | 013344/0378 | |
| Pages: | 4 |
| | Recorded: | 09/26/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10255878
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Filing Dt:
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09/26/2002
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Publication #:
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Pub Dt:
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04/01/2004
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Title:
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Post etch overlay metrology to avoid absorbing layers preventing measurements
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Assignee
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| ONE AMD PLACE |
| P.O. BOX 3453 |
| SUNNYVALE, CALIFORNIA 94088-3453 |
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Correspondence name and address
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FOLEY & LARDNER
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MARCUS W. SPROW
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777 EAST WISCONSIN AVENUE
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MILWAUKEE, WISCONSIN 53202-5367
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