Patent Assignment Details
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| Reel/Frame: | 013347/0773 | |
| Pages: | 2 |
| | Recorded: | 09/30/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/15/2005
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Application #:
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10136506
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Filing Dt:
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05/01/2002
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Publication #:
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Pub Dt:
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11/06/2003
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Title:
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COMPARATOR CIRCUIT FOR SEMICONDUCTOR TEST SYSTEM
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Assignee
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| NS BUILDING, 4-1, NISHI-SHINJUKU 2-CHOME |
| SHINJUKU-KU, TOKYO, JAPAN |
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Correspondence name and address
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MURAMATSU & ASSOCIATES
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YASUO MURAMATSU
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7700 IRVINE CENTER DRIVE, SUITE 225
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IRVINE, CA 92618
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