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Patent Assignment Details
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Reel/Frame:013841/0670   Pages: 2
Recorded: 11/01/2002
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
07/27/2004
Application #:
10275136
Filing Dt:
11/01/2002
Publication #:
Pub Dt:
07/03/2003
Title:
THICKNESS MEASURING APPARATUS, THICKNESS MEASURING METHOD, AND WET ETCHING APPARATUS AND WET ETCHING METHOD UTILIZING THEM
Assignors
1
Exec Dt:
10/01/2002
2
Exec Dt:
10/01/2002
Assignee
1
1126-1, ICHINO-CHO HAMAMATSU-SHI
SHIZUOKA 435-8558, JAPAN
Correspondence name and address
MORGAN LEWIS & BOCKIUS LLP
1111 PENNSYLVANIA AVENUE NW
WASHINGTON, DC 20004

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