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Patent Assignment Details
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Reel/Frame:013936/0686   Pages: 9
Recorded: 04/03/2003
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
11/01/2005
Application #:
10406645
Filing Dt:
04/03/2003
Publication #:
Pub Dt:
10/07/2004
Title:
METHOD OF REDUCING EROSION OF A NITRIDE GATE CAP LAYER DURING REACTIVE ION ETCH OF NITRIDE LINER LAYER FOR BIT LINE CONTACT OF DRAM DEVICE
Assignors
1
Exec Dt:
04/01/2003
2
Exec Dt:
03/18/2003
3
Exec Dt:
03/04/2003
4
Exec Dt:
03/04/2003
5
Exec Dt:
03/07/2003
6
Exec Dt:
03/04/2003
7
Exec Dt:
03/04/2003
8
Exec Dt:
03/04/2003
9
Exec Dt:
03/04/2003
Assignee
1
1730 NORTH FIRST STREET
SAN JOSE, CALIFORNIA 95112
Correspondence name and address
LERNER, DAVID, LITTENBERG, ET AL.
LAWRENCE E. RUSS
600 SOUTH AVENUE WEST
WESTFIELD, NJ 07090

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