Patent Assignment Details
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Reel/Frame: | 013940/0320 | |
| Pages: | 3 |
| | Recorded: | 04/02/2003 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/14/2004
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Application #:
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10406406
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Filing Dt:
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04/02/2003
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Title:
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METHOD OF TESTING THE THIN OXIDE OF A SEMICONDUCTOR MEMORY CELL THAT USES BREAKDOWN VOLTAGE
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Assignee
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1031 EAST DUANE AVENUE |
SUNNYVALE, CALIFORNIA 94085 |
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Correspondence name and address
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PERKINS COIE LLP
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CHUN M. NG
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P.O. BOX 1247
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PATENT-SEA
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SEATTLE, WA 98111-1247
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