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Patent #:
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Issue Dt:
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06/10/1986
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Application #:
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06472427
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Filing Dt:
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03/07/1983
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Title:
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PARTICIPATE REGISTER FOR PARALLEL LOADING PIN-ORIENTED REGISTERS IN TEST EQUIPMENT
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Patent #:
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Issue Dt:
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03/17/1987
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Application #:
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06611266
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Filing Dt:
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05/17/1984
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Title:
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GATE HAVING TEMPERATURE - STABILIZED DELAY
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Patent #:
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Issue Dt:
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11/18/1986
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Application #:
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06611454
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Filing Dt:
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05/17/1984
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Title:
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MULTIPLE-STAGE GATE NETWORK HAVING INDEPENDENT REFERENCE VOLTAGE SOURCES
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Patent #:
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Issue Dt:
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06/16/1987
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Application #:
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06631958
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Filing Dt:
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07/18/1984
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Title:
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METHOD AND APPARATUS FOR MINIMIZING DIGITAL-TO-ANALOG CONVERTER CORRECTION TRIMS
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Patent #:
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Issue Dt:
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09/05/1989
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Application #:
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06766905
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Filing Dt:
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08/16/1985
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Title:
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ELECTRON BEAM TEST PROBE FOR INTEGRATED CIRCUIT TESTING
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Patent #:
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Issue Dt:
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11/10/1987
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Application #:
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06798592
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Filing Dt:
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11/15/1985
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Title:
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ELECTRON BEAM TEST PROBE SYSTEM FOR ANALYZING INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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01/26/1988
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Application #:
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06828157
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Filing Dt:
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02/10/1986
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Title:
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APPARATUS FOR PULSING ELECTRON BEAMS
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Patent #:
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Issue Dt:
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01/03/1989
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Application #:
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06932762
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Filing Dt:
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11/19/1986
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Title:
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MULTI-MARKER, MULTI-DESTINATION TIMING SIGNAL GENERATOR
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Patent #:
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Issue Dt:
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03/27/1990
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Application #:
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07196776
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Filing Dt:
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05/17/1988
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Title:
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MAGNETIC LENS AND ELECTRON BEAM DEFLECTION SYSTEM
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Patent #:
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Issue Dt:
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10/01/1991
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Application #:
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07276359
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Filing Dt:
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11/23/1988
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Title:
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METHODS AND APPARATUS FOR ALIGNMENT OF IMAGES
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Patent #:
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Issue Dt:
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03/20/1990
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Application #:
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07284775
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Filing Dt:
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12/12/1988
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Title:
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A SINE WAVE GENERATOR USING A CORDIC ALOGORITHM
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Patent #:
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Issue Dt:
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02/25/1992
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Application #:
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07553202
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Filing Dt:
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07/13/1990
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Title:
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DUAL-SIDED TEST HEAD HAVING FLOATING CONTACT SURFACES
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Patent #:
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Issue Dt:
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05/18/1993
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Application #:
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07577986
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Filing Dt:
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09/05/1990
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Title:
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EVENT SEQUENCER FOR AUTOMATIC TEST EQUIPMENT
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Patent #:
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Issue Dt:
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07/06/1993
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Application #:
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07577987
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Filing Dt:
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09/05/1990
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Title:
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AUTOMATIC TEST EQUIPMENT SYSTEM USING PIN SLICE ARCHITECTURE
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Patent #:
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Issue Dt:
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08/18/1992
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Application #:
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07640636
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Filing Dt:
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01/14/1991
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Title:
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IC MODIFICATION WITH FOCUSED ION BEAM SYSTEM
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Patent #:
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Issue Dt:
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06/30/1992
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Application #:
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07655255
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Filing Dt:
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02/13/1991
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Title:
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HIGH RESOLUTION IMAGE COMPRESSION METHODS AND APPARATUS
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Patent #:
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Issue Dt:
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05/11/1993
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Application #:
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07710768
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Filing Dt:
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06/04/1991
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Title:
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DOUBLE-GATED INTEGRATING SCHEME FOR ELECTRON BEAM TESTER
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Patent #:
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Issue Dt:
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08/10/1993
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Application #:
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07729510
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Filing Dt:
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07/12/1991
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Title:
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APPARATUS FOR SETTING PIN DRIVER/SENSOR REFERENCE VOLTAGE LEVEL
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Patent #:
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Issue Dt:
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06/16/1992
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Application #:
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07732351
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Filing Dt:
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07/17/1991
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Title:
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DATA STREAM SMOOTHING USING A FIFO MEMORY
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Patent #:
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Issue Dt:
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09/01/1992
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Application #:
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07737553
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Filing Dt:
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07/25/1991
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Title:
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METHODS AND APPARATUS FOR ACQUIRING DATA FROM INTERMITTENTLY FAILING CIRCUITS
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Patent #:
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Issue Dt:
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02/21/1995
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Application #:
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07816639
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Filing Dt:
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12/30/1991
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Title:
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LOCATING A FIELD OF VIEW IN WHICH SELECTED IC CONDUCTORS ARE UNOBSCURED
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Patent #:
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Issue Dt:
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12/12/1995
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Application #:
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07876566
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Filing Dt:
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04/30/1992
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Title:
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TEST GENERATION BY ENVIRONMENT EMULATION
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Patent #:
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Issue Dt:
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12/14/1993
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Application #:
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07928919
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Filing Dt:
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08/12/1992
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Title:
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PULSED LASER PHOTOEMISSION ELECTRON-BEAM PROBE
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Patent #:
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Issue Dt:
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10/18/1994
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Application #:
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07980371
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Filing Dt:
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11/23/1992
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Title:
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FOCUSED ION BEAM PROCESSING WITH CHARGE CONTROL
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Patent #:
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Issue Dt:
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02/18/1997
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Application #:
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08031547
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Filing Dt:
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03/15/1993
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Title:
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DETERMINING OFFSET BETWEEN IMAGES OF AN IC
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Patent #:
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Issue Dt:
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02/15/1994
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Application #:
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08037507
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Filing Dt:
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03/24/1993
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Title:
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METHOD AND CIRCUIT FOR CONTROLLING VOLTAGE REFLECTIONS ON TRANSMISSION LINES
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Patent #:
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Issue Dt:
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12/19/1995
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Application #:
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08062362
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Filing Dt:
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05/13/1993
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Title:
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EVENT SEQUENCER FOR AUTOMATIC TEST EQUIPMENT
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Patent #:
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Issue Dt:
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07/04/1995
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Application #:
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08100975
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Filing Dt:
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08/03/1993
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Title:
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DRIVER CIRCUITS FOR IC TESTER
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Patent #:
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Issue Dt:
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03/28/1995
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Application #:
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08115997
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Filing Dt:
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09/02/1993
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Title:
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LAYOUT OVERLAY FOR FIB OPERATIONS
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Patent #:
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Issue Dt:
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01/02/1996
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Application #:
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08134330
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Filing Dt:
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10/12/1993
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Title:
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APPARATUS FOR MAINTAINING STIMULATION TO A DEVICE UNDER TEST AFTER A TEST STOPS
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Patent #:
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Issue Dt:
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06/25/1996
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Application #:
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08228027
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Filing Dt:
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04/15/1994
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Title:
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METHOD OF PROBING A NET OF AN IC AT AN OPTIMAL PROBE-POINT
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Patent #:
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Issue Dt:
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10/24/1995
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Application #:
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08267840
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Filing Dt:
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06/28/1994
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Title:
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AUTOMATIC TEST EQUIPMENT SYSTEM USING PIN SLICE ARCHITECTURE
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Patent #:
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Issue Dt:
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04/01/1997
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Application #:
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08268790
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Filing Dt:
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06/30/1994
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Title:
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SELF-MASKING FIB MILLING
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Patent #:
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Issue Dt:
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12/23/1997
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Application #:
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08434548
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Filing Dt:
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05/04/1995
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Title:
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INSULATOR DEPOSITION USING FOCUSED ION BEAM
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Patent #:
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Issue Dt:
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06/10/1997
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Application #:
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08488650
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Filing Dt:
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06/08/1995
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Title:
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PREDICTIVE WAVEFORM ACQUISITION
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Patent #:
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Issue Dt:
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03/24/1998
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Application #:
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08503023
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Filing Dt:
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07/17/1995
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Title:
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NECTOR-BASED WAVEFORM ACQUISITION AND DISPLAY
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Patent #:
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Issue Dt:
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08/05/1997
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Application #:
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08510395
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Filing Dt:
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08/01/1995
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Title:
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ACCURATE ALIGNMENT OF CLOCKS IN MIXED-SIGNAL TESTER
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Patent #:
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Issue Dt:
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07/08/1997
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Application #:
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08510397
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Filing Dt:
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08/01/1995
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Title:
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ANALOG CHANNEL FOR MIXED-SIGNAL-VLSI TESTER
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Patent #:
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Issue Dt:
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06/15/1999
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Application #:
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08573071
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Filing Dt:
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12/15/1995
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Title:
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LOADING HARDWARE PATTERN MEMORY IN AUTOMATIC TEST EQUIPMENT FOR TESTING CIRCUITS
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Patent #:
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Issue Dt:
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10/07/1997
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Application #:
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08626484
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Filing Dt:
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04/02/1996
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Title:
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OPTIMAL PROBE POINT PLACEMENT
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Patent #:
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Issue Dt:
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09/30/1997
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Application #:
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08696346
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Filing Dt:
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08/13/1996
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Title:
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ACCELERATED MODE TESTER TIMING
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Patent #:
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Issue Dt:
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04/06/1999
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Application #:
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08705795
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Filing Dt:
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08/30/1996
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Title:
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ATE TEST PROGRAMMING ARCHITECTURE
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Patent #:
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Issue Dt:
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04/28/1998
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Application #:
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08710032
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Filing Dt:
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09/11/1996
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Title:
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DRIVER CIRCUITS FOR IC TESTER
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Patent #:
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Issue Dt:
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05/05/1998
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Application #:
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08734746
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Filing Dt:
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10/21/1996
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Title:
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THERMOELECTRIC COOLING IN GAS-ASSISTED FIB SYSTEM
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Patent #:
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Issue Dt:
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06/29/1999
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Application #:
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08734994
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Filing Dt:
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10/22/1996
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Title:
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GENERATING PULSES IN ANALOG CHANNEL OF ATE TESTER
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Patent #:
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Issue Dt:
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09/28/1999
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Application #:
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08745885
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Filing Dt:
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11/08/1996
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Title:
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METHOD AND APPARATUS FOR MEASURING ELECTRICAL WAVEFORMS USING ATOMIC FORCE MICROSCOPY
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Patent #:
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Issue Dt:
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06/20/2000
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Application #:
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08756296
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Filing Dt:
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11/25/1996
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Title:
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SYSTEM, METHODS AND APPARATUS FOR STORING INFORMATION DURING A SEMICONDUCTOR MANUFACTURING PROCESS
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Patent #:
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Issue Dt:
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05/05/1998
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Application #:
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08762395
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Filing Dt:
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12/09/1996
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Title:
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ANALOG CHANNEL FOR MIXED-SIGNAL-VLSI TESTER
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Patent #:
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Issue Dt:
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05/09/2000
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Application #:
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08762611
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Filing Dt:
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12/09/1996
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Title:
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PROGRAM UTILITY REGISTER TO GENERATE ADDRESSES IN ALGORITHMIC PATTERN GENERATOR
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Patent #:
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Issue Dt:
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05/18/1999
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Application #:
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08770621
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Filing Dt:
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12/19/1996
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Title:
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CHARGED PARTICLE BEAM SYSTEM WITH OPTICAL MICROSCOPE
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Patent #:
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Issue Dt:
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11/24/1998
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Application #:
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08771804
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Filing Dt:
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12/20/1996
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Title:
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FBI ETCHING ENHANCED WITH 1,2 DI-IODO-ETHANE
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Patent #:
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Issue Dt:
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03/16/1999
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Application #:
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08801687
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Filing Dt:
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02/18/1997
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Title:
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PATTERN GENERATOR WITH EXTENDED REGISTER PROGRAMMING
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Patent #:
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Issue Dt:
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10/13/1998
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Application #:
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08811104
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Filing Dt:
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03/03/1997
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Title:
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THROUGH-THE-SUBSTRATE INVESTIGATION OF FLIP-CHIP IC'S
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Patent #:
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Issue Dt:
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05/18/1999
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Application #:
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08818345
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Filing Dt:
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03/15/1997
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Title:
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DUAL-LASER VOLTAGE PROBING OF IC'S
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Patent #:
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Issue Dt:
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07/06/1999
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Application #:
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08841413
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Filing Dt:
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04/22/1997
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Title:
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OPTICAL SYSTEM
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Patent #:
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Issue Dt:
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12/21/1999
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Application #:
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08849290
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Filing Dt:
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05/14/1997
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Title:
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METHOD AND EQUIPMENT FOR AUTOMATICALLY TESTING ELECTRONIC COMPONENTS
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Patent #:
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Issue Dt:
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01/11/2000
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Application #:
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08858992
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Filing Dt:
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05/20/1997
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Title:
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PROVIDING TEST VECTORS WITH PATTERN CHAINING DEFINITION
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Patent #:
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Issue Dt:
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08/31/1999
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Application #:
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08930490
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Filing Dt:
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09/30/1997
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Title:
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METHOD AND APPARATUS FOR SELECTIVELY TESTING INDENTICAL PINS OF A PLURALITY OF ELECTRONIC COMPONENTS
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Patent #:
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Issue Dt:
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04/11/2000
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Application #:
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08930492
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Filing Dt:
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09/30/1997
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Title:
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AUTOMATIC PARALLEL ELECTRONIC COMPONENT TESTING METHOD AND EQUIPMENT
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Patent #:
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Issue Dt:
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11/30/1999
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Application #:
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08930501
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Filing Dt:
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09/30/1997
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Title:
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METHOD AND APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC COMPONENTS IN PARALLEL UTILIZING DIFFERENT TIMING SIGNALS FOR EACH ELECTRONIC COMPONENT
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Patent #:
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Issue Dt:
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06/27/2000
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Application #:
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08949747
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Filing Dt:
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10/14/1997
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Title:
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MEASURING SIGNALS IN A TESTER SYSTEM
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Patent #:
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Issue Dt:
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10/03/2000
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Application #:
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08977649
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Filing Dt:
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11/24/1997
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Title:
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TESTER HAVING EVENT GENERATION CIRCUIT FOR ACQUIRING WAVEFORM BY SUPPLYING STROBE EVENTS FOR WAVEFORM ACQUISITION RATHER THAN USING STROBE EVENTS SPECIFIED BY THE TEST PROGRAM
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Patent #:
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Issue Dt:
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02/29/2000
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Application #:
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09082455
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Filing Dt:
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05/20/1998
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Title:
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AUTOMATIC SEQUENCING OF FIB OPERATIONS
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Patent #:
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Issue Dt:
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05/01/2001
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Application #:
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09163710
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Filing Dt:
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09/30/1998
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Title:
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THROUGH-THE- SUBSTRATE INVESTIGATION OF FLIP CHIP IC'S
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Patent #:
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Issue Dt:
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07/17/2001
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Application #:
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09284939
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Filing Dt:
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04/22/1999
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Title:
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DEVICE FOR CONTROLLING CONFORMITY OF CONSUMPTION OF AN ELECTRONIC COMPONENT IN A TESTING MACHINE
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Patent #:
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Issue Dt:
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02/17/2004
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Application #:
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09350611
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Filing Dt:
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07/09/1999
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Title:
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SECURING DATA IN A MACHINE FOR TESTING ELECTRONIC COMPONENTS
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Patent #:
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Issue Dt:
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01/30/2001
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Application #:
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09367376
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Filing Dt:
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10/25/1999
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Title:
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POWER SUPPLY CIRCUIT OF AN ELECTRONIC COMPONENT IN A TEST MACHINE
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Patent #:
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Issue Dt:
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12/09/2003
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Application #:
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09419317
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Filing Dt:
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10/17/1999
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Title:
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MEASURING JITTER OF HIGH-SPEED DATA CHANNELS
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Patent #:
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Issue Dt:
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12/30/2003
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Application #:
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09421784
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Filing Dt:
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10/19/1999
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Title:
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PACKET-BASED DEVICE TEST SYSTEM
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Patent #:
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Issue Dt:
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06/25/2002
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Application #:
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09440985
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Filing Dt:
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11/16/1999
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Title:
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ENERGY FILTERED FOCUSED ION BEAM COLUMN
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Patent #:
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Issue Dt:
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09/04/2001
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Application #:
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09452058
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Filing Dt:
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11/30/1999
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Title:
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MEASURING SIGNALS IN A TESTER SYSTEM
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Patent #:
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Issue Dt:
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06/26/2001
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Application #:
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09483463
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Filing Dt:
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01/13/2000
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Title:
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Differential Pulsed Laser Beam Probing of Integrated Circuits
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Patent #:
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Issue Dt:
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12/17/2002
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Application #:
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09500757
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Filing Dt:
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02/08/2000
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Title:
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DOUBLE-PULSED OPTICAL INTERFEROMETER FOR WAVEFORM PROBING OF INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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04/22/2003
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Application #:
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09510101
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Filing Dt:
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02/22/2000
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Title:
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VALUATION OF TESTER ACCURACY
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Patent #:
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Issue Dt:
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12/10/2002
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Application #:
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09514708
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Filing Dt:
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02/28/2000
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Title:
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SOCKET CALIBRATION METHOD AND APPARATUS
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Patent #:
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Issue Dt:
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12/17/2002
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Application #:
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09526407
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Filing Dt:
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03/15/2000
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Title:
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CALIBRATION METHOD AND APPARATUS FOR CORRECTING PULSE WIDTH TIMING ERRORS IN INTEGRATED CIRCUIT TESTING
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Patent #:
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Issue Dt:
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10/08/2002
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Application #:
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09526979
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Filing Dt:
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03/15/2000
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Title:
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BEAM DELIVERY AND IMAGING FOR OPTICAL PROBING OF A DEVICE OPERATING UNDER ELECTRICAL TEST
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Patent #:
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Issue Dt:
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11/02/2004
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Application #:
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09628116
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Filing Dt:
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07/28/2000
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Title:
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SUPERCONDUCTING SINGLE PHOTON DETECTOR
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Patent #:
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Issue Dt:
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12/31/2002
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Application #:
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09643576
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Filing Dt:
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08/22/2000
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Title:
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TIME-TO-DIGITAL CONVERTER
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Patent #:
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Issue Dt:
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09/16/2003
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Application #:
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09648716
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Filing Dt:
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08/25/2000
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Title:
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EDGE PLACEMENT AND JITTER MEASUREMENT FOR ELECTRONIC ELEMENTS
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Patent #:
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Issue Dt:
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12/31/2002
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Application #:
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09675090
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Filing Dt:
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09/28/2000
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Title:
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ON-CHIP OPTICALLY TRIGGERED LATCH FOR IC TIME MEASUREMENTS
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Patent #:
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Issue Dt:
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10/07/2003
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Application #:
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09675981
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Filing Dt:
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09/29/2000
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Title:
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COMPACT, HIGH COLLECTION EFFICIENCY SCINTILLATOR FOR SECONDARY ELECTRON DETECTION
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Patent #:
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Issue Dt:
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07/16/2002
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Application #:
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09676144
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Filing Dt:
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09/29/2000
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Title:
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TEST SYSTEM AND ASSOCIATED INTERFACE MODULE
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Patent #:
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Issue Dt:
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04/12/2005
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Application #:
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09676292
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Filing Dt:
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09/28/2000
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Title:
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METHOD AND APPARATUS FOR REMOTELY TESTING SEMICONDUCTORS
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Patent #:
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Issue Dt:
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02/22/2005
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Application #:
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09679042
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Filing Dt:
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10/02/2000
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Title:
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METHOD AND APPARATUS FOR HIGH SPEED IC TEST INTERFACE
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Patent #:
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Issue Dt:
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06/08/2004
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Application #:
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09696102
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Filing Dt:
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10/24/2000
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Title:
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SCAN STREAM SEQUENCING FOR TESTING INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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01/10/2006
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Application #:
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09746618
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Filing Dt:
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12/21/2000
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Publication #:
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Pub Dt:
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08/22/2002
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Title:
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OPTICAL COUPLING FOR TESTING INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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02/11/2003
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Application #:
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09781488
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Filing Dt:
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02/10/2001
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Publication #:
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Pub Dt:
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08/02/2001
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Title:
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THROUGH-THE-SUBSTRATE INVESTIGATION OF FLIP-CHIP IC'S
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Patent #:
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Issue Dt:
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02/04/2003
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Application #:
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09871541
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Filing Dt:
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05/31/2001
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Publication #:
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Pub Dt:
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07/18/2002
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Title:
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CHEMICALLY ENHANCED FOCUSED ION BEAM MICRO-MACHINING OF COPPER
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Patent #:
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Issue Dt:
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01/06/2004
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Application #:
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09924736
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Filing Dt:
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08/07/2001
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Publication #:
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Pub Dt:
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01/30/2003
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Title:
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METHOD FOR GLOBAL DIE THINNING AND POLISHING OF FLIP-CHIP PACKAGED INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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05/18/2004
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Application #:
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10004018
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Filing Dt:
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10/18/2001
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Publication #:
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Pub Dt:
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04/24/2003
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Title:
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PHOTOCONDUCTIVE-SAMPLING VOLTAGE MEASUREMENT
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Patent #:
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Issue Dt:
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09/26/2006
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Application #:
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10056287
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Filing Dt:
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01/23/2002
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Publication #:
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Pub Dt:
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07/24/2003
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Title:
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CIRCUIT AND METHOD FOR DISTRIBUTING EVENTS IN AN EVENT STREAM
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Patent #:
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Issue Dt:
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11/23/2004
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Application #:
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10057134
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Filing Dt:
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01/24/2002
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Publication #:
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Pub Dt:
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07/24/2003
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Title:
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COMPARATOR CIRCUIT FOR DIFFERENTIAL SWING COMPARISON AND COMMON-MODE VOLTAGE COMPARISON
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Patent #:
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Issue Dt:
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11/16/2004
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Application #:
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10066123
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Filing Dt:
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01/30/2002
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Publication #:
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Pub Dt:
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07/31/2003
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Title:
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PICA SYSTEM TIMING MEASUREMENT & CALIBRATION
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Patent #:
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Issue Dt:
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09/26/2006
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Application #:
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10079780
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Filing Dt:
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02/19/2002
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Publication #:
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Pub Dt:
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08/21/2003
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Title:
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PICA SYSTEM DETECTOR CALIBRATION
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Patent #:
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Issue Dt:
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03/21/2006
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Application #:
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10101564
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Filing Dt:
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03/18/2002
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Publication #:
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Pub Dt:
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02/13/2003
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Title:
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TEST SYSTEM FORMATTERS CONFIGURABLE FOR MULTIPLE DATA RATES
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Patent #:
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Issue Dt:
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11/28/2006
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Application #:
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10102526
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Filing Dt:
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03/19/2002
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Publication #:
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Pub Dt:
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12/12/2002
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Title:
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TEST SYSTEM ALGORITHMIC PROGRAM GENERATORS
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Patent #:
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Issue Dt:
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09/21/2004
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Application #:
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10106280
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03/25/2002
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Publication #:
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Pub Dt:
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09/26/2002
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Title:
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METHOD AND APPARATUS FOR SOCKET CALIBRATION OF INTEGRATED CIRCUIT TESTERS
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Patent #:
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03/29/2005
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10123842
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04/15/2002
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10/17/2002
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Title:
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MEASURING BACK-SIDE VOLTAGE OF AN INTEGRATED CIRCUIT
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02/18/2003
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10132051
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04/24/2002
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08/22/2002
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Title:
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TEST SYSTEM HAVING INTERFACE MODULE
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