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Patent Assignment Details
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Reel/Frame:014445/0827   Pages: 3
Recorded: 08/28/2003
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
10/25/2005
Application #:
10649833
Filing Dt:
08/28/2003
Publication #:
Pub Dt:
03/04/2004
Title:
TEST METHOD AND APPARATUS FOR VERIFYING FABRICATION OF TRANSISTORS IN AN INTEGRATED CIRCUIT
Assignor
1
Exec Dt:
08/27/2003
Assignee
1
1753 SHIMONUMABE
NAKAHARA-KU
KAWASAKI, JAPAN 211-8668
Correspondence name and address
MCGINN & GIBB, PLLC
SEAN M. MCGINN, ESQ.
8321 OLD COURTHOUSE ROAD
SUITE 200 VIENNA, VA 22182-3817

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