Patent Assignment Details
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Reel/Frame: | 014481/0131 | |
| Pages: | 3 |
| | Recorded: | 08/25/2003 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/03/2008
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Application #:
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10363746
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Filing Dt:
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08/25/2003
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Publication #:
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Pub Dt:
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02/26/2004
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Title:
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APPARATUS FOR INSPECTING WAFER SURFACE, METHOD FOR INSPECTING WAFER SURFACE, APPARATUS FOR JUDGING DEFECTIVE WAFER, METHOD FOR JUDGING DEFECTIVE WAFER, AND APPARATUS FOR PROCESSING INFORMATION ON WAFER SURFACE
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Assignee
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25-1, SHINOMIYA 3-CHOME |
HIRATSUKA-SHI |
KANAGAWA 254-0014, JAPAN |
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Correspondence name and address
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WELSH & KATZ, LTD.
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GERALD T. SHEKLETON
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120 SOUTH RIVERSIDE PLAZA
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22ND FLOOR
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CHICAGO, IL 60606
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