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Patent Assignment Details
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Reel/Frame:014545/0033   Pages: 3
Recorded: 10/01/2003
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 3
1
Patent #:
Issue Dt:
09/23/2003
Application #:
10175301
Filing Dt:
06/20/2002
Publication #:
Pub Dt:
02/13/2003
Title:
SEMICONDUCTOR MEMORY DEVICE
2
Patent #:
Issue Dt:
08/23/2005
Application #:
10190480
Filing Dt:
07/09/2002
Publication #:
Pub Dt:
03/06/2003
Title:
SEMICONDUCTOR MEMORY CIRCUIT
3
Patent #:
Issue Dt:
10/19/2004
Application #:
10360867
Filing Dt:
02/10/2003
Publication #:
Pub Dt:
07/03/2003
Title:
METHOD OF TESTING A SEMICONDUCTOR INTEGRATED DEVICE
Assignor
1
Exec Dt:
09/12/2003
Assignee
1
4-1, MARUNOUCHI 2-CHOME
CHIYODA-KU, TOKYO, JAPAN
Correspondence name and address
REED SMITH LLP
STANLEY P. FISHER
3110 FAIRVIEW PARK DR.
SUITE 1400
FALLS CHURCH, VA 22042

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