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Reel/Frame:014638/0399   Pages: 5
Recorded: 10/22/2003
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
08/02/2005
Application #:
10691940
Filing Dt:
10/22/2003
Title:
VOID CHARACTERIZATION IN METAL INTERCONNECT STRUCTURES USING X-RAY EMISSION ANALYSES
Assignors
1
Exec Dt:
10/14/2003
2
Exec Dt:
10/14/2003
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
BEYER WEAVER & THOMAS, LLP
P.O. BOX 778
BERKELEY, CA 94704-0778

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