Patent Assignment Details
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| Reel/Frame: | 014735/0829 | |
| Pages: | 4 |
| | Recorded: | 12/01/2003 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/19/2007
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Application #:
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10678788
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Filing Dt:
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10/03/2003
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Publication #:
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Pub Dt:
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04/07/2005
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Title:
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METHOD FOR IMPROVING THE CRITICAL DIMENSION UNIFORMITY OF PATTERNED FEATURES ON WAFERS
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Assignee
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| NO. 8, LI-HSIN ROAD 6 |
| SCIENCE-BASED INDUSTRIAL PARK |
| HSIN-CHU, TAIWAN 300-77 |
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Correspondence name and address
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HAYNES AND BOONE, LLP
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DAVID M. O'DELL
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901 MAIN STREET, SUITE 3100
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DALLAS, TX 75202
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