Patent Assignment Details
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| Reel/Frame: | 015051/0626 | |
| Pages: | 3 |
| | Recorded: | 03/04/2004 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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10/17/2006
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Application #:
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10793441
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Filing Dt:
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03/04/2004
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Publication #:
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Pub Dt:
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09/08/2005
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Title:
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SYSTEM AND METHOD FOR CHECK-IN CONTROL IN WAFER TESTING
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Assignee
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| NO. 8, LI-HSIN RD. 6 |
| SCIENCE-BASED INDUSTRIAL PARK |
| HSIN-CHU, TAIWAN, CHINA 300-77 |
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Correspondence name and address
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THOMAS, KAYDEN, HORSTEMEYER ET.AL.
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DANIEL R. MCCLURE
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100 GALLERIA PARKWAY, SUITE 1750
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ATLANTA, GA 30339-5948
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