Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 015065/0870 | |
| Pages: | 6 |
| | Recorded: | 08/18/2004 | | |
| Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
3
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Patent #:
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Issue Dt:
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12/14/1999
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Application #:
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08831298
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Filing Dt:
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04/01/1997
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Title:
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SYSTEM QUALITY CONTROL WHERE INSPECTION FREQUENCY OF INSPECTION APPARATUS IS RESET TO MINIMIZE EXPECTED TOTAL LOSS BASED ON DERIVED FREQUENCY FUNCTION AND LOSS VALUE
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Patent #:
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Issue Dt:
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04/05/2005
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Application #:
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10119018
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Filing Dt:
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04/10/2002
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Publication #:
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Pub Dt:
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12/05/2002
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Title:
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METHOD FOR ANALYZING DEFECT DATA AND INSPECTION APPARATUS AND REVIEW SYSTEM
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Patent #:
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Issue Dt:
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08/30/2005
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Application #:
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10230416
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Filing Dt:
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08/29/2002
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Publication #:
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Pub Dt:
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01/02/2003
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Title:
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METHOD AND ITS APPARATUS FOR INSPECTING PARTICLES OR DEFECTS OF A SEMICONDUCTOR DEVICE
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Assignee
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| 16-3, HIGASHI 3-CHOME |
| SHIBUYA-KU, TOKYO, JAPAN |
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Correspondence name and address
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ANTONELLI, TERRY, STOUT ET.AL.
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ALAN E. SCHIAVELLI
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1300 N. 17TH STREET
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SUITE 1800
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ARLINGTON, VA 22209
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